dc.contributor.author
Baghban-Bousari, N.
dc.contributor.author
Eric, Deborah
dc.contributor.author
Palau, Gerard
dc.contributor.author
Crespo Yepes, Albert
dc.contributor.author
Porti i Pujal, Marc
dc.contributor.author
Ramon, Eloi
dc.contributor.author
Ogier, S.
dc.contributor.author
Nafría i Maqueda, Montserrat
dc.identifier
https://ddd.uab.cat/record/320859
dc.identifier
urn:10.1016/j.mee.2025.112407
dc.identifier
urn:oai:ddd.uab.cat:320859
dc.identifier
urn:oai:egreta.uab.cat:publications/0cdb033d-4abb-43a7-9135-ffb4fd6aec26
dc.identifier
urn:pure_id:507656390
dc.identifier
urn:scopus_id:105016017121
dc.identifier
urn:articleid:01679317v302p112407
dc.description.abstract
Altres ajuts: acords transformatius de la UAB
dc.description.abstract
Pre-stressed commercial Organic Thin Film Transistors (OTFT) have been characterized to evaluate their suitability for Physical Unclonable Functions (PUFs) implementation, when the variability of the drain current (ID) is used as entropy source. Different kinds of electrical pre-stresses have been considered, to study their impact on the PUF reproducibility. Uniqueness and Uniformity of the resulting PUFs have also been evaluated. The proposed pre-stressed OTFTs based PUFs show a reproducibility up to 0.99, with a uniformity and uniqueness of 0.52 and 0.50, respectively.
dc.format
application/pdf
dc.relation
Agencia Estatal de Investigación PID2022-136949OB-C22
dc.relation
Agència de Gestió d'Ajuts Universitaris i de Recerca 2021/SGR-00199
dc.relation
Microelectronic engineering ; Vol. 302 (January 2026), art. 112407
dc.rights
Aquest document està subjecte a una llicència d'ús Creative Commons. Es permet la reproducció total o parcial, la distribució, la comunicació pública de l'obra i la creació d'obres derivades, fins i tot amb finalitats comercials, sempre i quan es reconegui l'autoria de l'obra original.
dc.rights
https://creativecommons.org/licenses/by/4.0/
dc.title
Feasibility of Physical Unclonable Functions from Pre-stressed Organic Thin Film Transistors for Secure Microelectronics
