dc.contributor
Universitat Politècnica de Catalunya. Departament de Disseny i Programació de Sistemes Electrònics
dc.contributor
Universitat Politècnica de Catalunya. CIRCUIT - Grup de Recerca en Circuits i Sistemes de Comunicació
dc.contributor.author
Lai, Chia-Yun
dc.contributor.author
Barcons Xixons, Víctor
dc.contributor.author
Santos, Sergio
dc.contributor.author
Chiesa, Matteo
dc.date.issued
2015-07-28
dc.identifier
Lai, C., Barcons, V., Santos, S., Chiesa, M. Periodicity in bimodal atomic force microscopy. "Journal of applied physics", 28 Juliol 2015, núm. 4, p. 1-5.
dc.identifier
https://hdl.handle.net/2117/76907
dc.identifier
10.1063/1.4927733
dc.description.abstract
Periodicity is fundamental for quantification and the application of conservation principles of many important systems. Here, we discuss periodicity in the context of bimodal atomic force microscopy (AFM). The relationship between the excited frequencies is shown to affect and control both experimental observables and the main expressions quantified via these observables, i.e., virial and energy transfer expressions, which form the basis of the bimodal AFM theory. The presence of a fundamental frequency further simplifies the theory and leads to close form solutions. Predictions are verified via numerical integration of the equation of motion and experimentally on a mica surface.
dc.description.abstract
Peer Reviewed
dc.description.abstract
Postprint (published version)
dc.format
application/pdf
dc.publisher
American Institute of Physics (AIP)
dc.rights
http://creativecommons.org/licenses/by/3.0/es/
dc.subject
Àrees temàtiques de la UPC::Física
dc.subject
Àrees temàtiques de la UPC::Enginyeria electrònica
dc.subject
Atomic force microscopy
dc.subject
Microscòpia de força atòmica
dc.title
Periodicity in bimodal atomic force microscopy
