Requirements for noise parameter measurements in superconducting electronic systems

Other authors

Universitat Politècnica de Catalunya. Departament de Teoria del Senyal i Comunicacions

Universitat Politècnica de Catalunya. RF&MW - Grup de Recerca de sistemes, dispositius i materials de RF i microones

Publication date

1991

Abstract

General considerations on the measurement of noise parameters in highly mismatched systems are discussed. In particular, the problem of noise characterization of active superconducting microwave devices is addressed. A measurement technique that includes an error analysis is presented along with current data for a superconducting flux flow transistor.


Peer Reviewed


Postprint (published version)

Document Type

Conference report

Language

English

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Related items

http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=146971

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Rights

Open Access

This item appears in the following Collection(s)

E-prints [73054]