Dielectric characterization of multiferroic magnetoelectric double-perovskite Y(Ni0.5Mn0.5)O3 thin films

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RECERCAT Home > Universitat de Barcelona > Física Aplicada > Articles publicats en revistes (Física Aplicada) > View document

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Title:	Dielectric characterization of multiferroic magnetoelectric double-perovskite Y(Ni0.5Mn0.5)O3 thin films
Author:	Coy, L. E.; Fina, I.; Ventura, J.; Yate, L.; Langenberg, E.; Polo Trasancos, Ma. del Carmen; Ferrater Martorell, Cèsar; Varela Fernández, Manuel, 1956-
Other authors:	Universitat de Barcelona
Abstract:	We report on functional properties of Y(Ni0.5Mn0.5)O3 epitaxial thin films, growth by pulsed laser deposition, observing clear features of its ferroelectric and ferromagnetic nature at cryogenic temperature. Temperature-dependent complex impedance spectroscopy (IS) characterization has shown a dielectric anomaly around the ferromagnetic Curie temperature ( 100 K) indicative of coupling between magnetic and electric orders.
Subject(s):	-Pel·lícules fines -Materials ferromagnètics -Ferromagnetisme -Ferroelectricitat -Thin films -Ferromagnetic materials -Ferromagnetism -Ferroelectricity
Rights:	(c) American Institute of Physics , 2016
Document type:	Article Article - Accepted version
Published by:	American Institute of Physics
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