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dc.contributor | Universitat de Barcelona |
---|---|
dc.contributor.author | Bulashenko, Oleg |
dc.contributor.author | Gaubert, P. |
dc.contributor.author | Varani, L. |
dc.contributor.author | Vaissiere, J. C. |
dc.contributor.author | Nougier, J. P. |
dc.date | 2012-02-16T08:49:41Z |
dc.date | 2012-02-16T08:49:41Z |
dc.date | 2000 |
dc.identifier.citation | 0021-8979 |
dc.identifier.citation | 517048 |
dc.identifier.uri | http://hdl.handle.net/2445/22099 |
dc.format | 8 p. |
dc.format | application/pdf |
dc.language.iso | eng |
dc.publisher | American Institute of Physics |
dc.relation | Reproducció del document publicat a: http://dx.doi.org/10.1063/1.1309120 |
dc.relation | Journal of Applied Physics, 2000, vol. 88, núm. 8, p. 4709-4716 |
dc.relation | http://dx.doi.org/10.1063/1.1309120 |
dc.rights | (c) American Institute of Physics, 2000 |
dc.rights | info:eu-repo/semantics/openAccess |
dc.subject | Díodes |
dc.subject | Soroll |
dc.subject | Camps elèctrics |
dc.subject | Semiconductors |
dc.subject | Mètode de Montecarlo |
dc.subject | Electrònica de l'estat sòlid |
dc.subject | Microelectrònica |
dc.subject | Diodes |
dc.subject | Noise |
dc.subject | Electric fields |
dc.subject | Semiconductors |
dc.subject | Monte Carlo method |
dc.subject | Solid state electronics |
dc.subject | Microelectronics |
dc.title | Impedance field and noise of submicrometer n+ nn+ diodes: analytical approach |
dc.type | info:eu-repo/semantics/article |
dc.type | info:eu-repo/semantics/publishedVersion |
dc.description.abstract |