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dc.contributor | Osten, Wolfgang |
---|---|
dc.contributor | Gorecki, Christophe |
dc.contributor | Novak, Erik L. |
dc.contributor | Universitat Politècnica de Catalunya. Departament d'Òptica i Optometria |
dc.contributor | Universitat Politècnica de Catalunya. GREO - Grup de Recerca en Enginyeria Òptica |
dc.contributor.author | Caum Aregay, Jesús |
dc.contributor.author | Arasa Marti, Jose |
dc.contributor.author | Royo Royo, Santiago |
dc.contributor.author | Ares Rodríguez, Miguel |
dc.date | 2005-06-13 |
dc.identifier.citation | Caum, J. [et al.]. Application of matched digital filters to noisy fringe-patterns from complex wavefronts. "SPIE", 13 Juny 2005, vol. 5856, p. 227-237. |
dc.identifier.citation | 0-8194-5856-2 |
dc.identifier.citation | 10.1117/12.612835 |
dc.identifier.uri | http://hdl.handle.net/2117/17831 |
dc.language.iso | eng |
dc.publisher | Proc.SPIE Press |
dc.relation | http://spie.org/x648.html?product_id=612835 |
dc.rights | Attribution-NonCommercial-NoDerivs 3.0 Spain |
dc.rights | info:eu-repo/semantics/openAccess |
dc.rights | http://creativecommons.org/licenses/by-nc-nd/3.0/es/ |
dc.subject | Àrees temàtiques de la UPC::Enginyeria electrònica |
dc.subject | Metrology |
dc.subject | Digital filters |
dc.subject | Diffraction patterns |
dc.subject | Metrologia |
dc.subject | Filtres digitals |
dc.title | Application of matched digital filters to noisy fringe-patterns from complex wavefronts |
dc.title | Optical Measurement Systems for Industrial Inspection IV |
dc.type | info:eu-repo/semantics/publishedVersion |
dc.type | info:eu-repo/semantics/article |