Spectral analysis of the angular distribution function of back reflectors for thin film silicon solar cells

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dc.contributor	Universitat de Barcelona
dc.contributor.author	Escarré i Palou, Jordi
dc.contributor.author	Villar, Fernando
dc.contributor.author	Asensi López, José Miguel
dc.contributor.author	Bertomeu i Balagueró, Joan
dc.contributor.author	Andreu i Batallé, Jordi
dc.date	2013-10-25T06:36:15Z
dc.date	2013-10-25T06:36:15Z
dc.date	2006
dc.date	2013-10-25T06:36:15Z
dc.identifier.citation	0022-3093
dc.identifier.citation	533803
dc.identifier.uri	http://hdl.handle.net/2445/47283
dc.format	12 p.
dc.format	application/pdf
dc.language.iso	eng
dc.publisher	Elsevier B.V.
dc.relation	Versió postprint del document publicat a: http://dx.doi.org/10.1016/j.jnoncrysol.2005.12.046
dc.relation	Journal of non-Crystalline Solids, 2006, vol. 352, num. 9-20, p. 1896-1899
dc.relation	http://dx.doi.org/10.1016/j.jnoncrysol.2005.12.046
dc.rights	(c) Elsevier B.V., 2006
dc.rights	info:eu-repo/semantics/openAccess
dc.subject	Cèl·lules solars
dc.subject	Pel·lícules fines
dc.subject	Espectroscòpia
dc.subject	Fotons
dc.subject	Òptica
dc.subject	Energia solar
dc.subject	Absorció
dc.subject	Solar cells
dc.subject	Thin films
dc.subject	Spectrum analysis
dc.subject	Photons
dc.subject	Optics
dc.subject	Solar energy
dc.subject	Absorption
dc.title	Spectral analysis of the angular distribution function of back reflectors for thin film silicon solar cells
dc.type	info:eu-repo/semantics/article
dc.type	info:eu-repo/semantics/acceptedVersion
dc.description.abstract	Nowadays, one of the most important challenges to enhance the efficiency of thin film silicon solar cells is to increase the short circuit intensity by means of optical confinement methods, such as textured back-reflector structures. In this work, two possible textured structures to be used as back reflectors for n-i-p solar cells have been optically analyzed and compared to a smooth one by using a system which is able to measure the angular distribution function (ADF) of the scattered light in a wide spectral range (350-1000 nm). The accurate analysis of the ADF data corresponding to the reflector structures and to the μc-Si:H films deposited onto them allows the optical losses due to the reflector absorption and its effectiveness in increasing light absorption in the μc-Si:H layer, mainly at long wavelengths, to be quantified.

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