Para acceder a los documentos con el texto completo, por favor, siga el siguiente enlace: http://hdl.handle.net/2445/134698
dc.contributor.author | Levcenko, Sergiu |
---|---|
dc.contributor.author | Hajdeu Chicarosh, Elena |
dc.contributor.author | Garcia Llamas, Elena |
dc.contributor.author | Caballero, Raquel |
dc.contributor.author | Serna, Rosalía |
dc.contributor.author | Bodnar, Ivan V. |
dc.contributor.author | Victorov, Ivan A. |
dc.contributor.author | Guc, Maxim |
dc.contributor.author | Merino, José Manuel |
dc.contributor.author | Pérez Rodríguez, Alejandro |
dc.contributor.author | Arushanov, Ernest |
dc.contributor.author | León, Máximo |
dc.date | 2019-06-06T10:13:26Z |
dc.date | 2019-06-06T10:13:26Z |
dc.date | 2018-04-19 |
dc.date | 2019-06-06T10:13:27Z |
dc.identifier.citation | 0003-6951 |
dc.identifier.citation | 683366 |
dc.identifier.uri | http://hdl.handle.net/2445/134698 |
dc.format | 1 p. |
dc.format | application/pdf |
dc.language.iso | eng |
dc.publisher | American Institute of Physics |
dc.relation | Reproducció del document publicat a: https://doi.org/10.1063/1.5024683 |
dc.relation | Applied Physics Letters, 2018, vol. 112, num. 16, p. 161901-1-161901-5 |
dc.relation | https://doi.org/10.1063/1.5024683 |
dc.rights | (c) American Institute of Physics , 2018 |
dc.rights | info:eu-repo/semantics/openAccess |
dc.subject | El·lipsometria |
dc.subject | Dispositius optoelectrònics |
dc.subject | Propietats òptiques |
dc.subject | Ellipsometry |
dc.subject | Optoelectronic devices |
dc.subject | Optical properties |
dc.title | Spectroscopic ellipsometry study of Cu2ZnSnS4 bulk poly-crystals |
dc.type | info:eu-repo/semantics/article |
dc.type | info:eu-repo/semantics/publishedVersion |
dc.description.abstract |