Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica
Universitat Politècnica de Catalunya. MNT - Grup de Recerca en Micro i Nanotecnologies
2005-01
We propose the use of annealed phosphorus doped amorphous silicon carbide layers (a-SiC:H(n)) deposited by PECVD as emitters in solar cells and explore the effect of the annealing time on the emitter saturation current density (). We use the quasy-steady state photoconductance method to determine the dependence of effective lifetime on excess carrier density and from these measurements we obtain values in the range of 300 fA cm-2 for sheet resistances around 100 O¿sq. Finally, we obtain effective surface recombination velocity values around 104 cm s-1 by fitting the measured values with PC1D simulated ones.
Peer Reviewed
Postprint (published version)
Article
English
Àrees temàtiques de la UPC::Energies::Energia solar fotovoltaica::Cèl·lules solars; Silicon-carbide thin film; Solar cells; Amorphous silicon carbide (a-SIC:H(n)); Solar cells; Emitter saturation current density; Passivation; Capes fines de carbur de silici; Cèl·lules solars
https://www.sciencedirect.com/science/article/pii/S0927024804003848
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E-prints [72986]