dc.contributor
Universitat Politècnica de Catalunya. Departament de Disseny i Programació de Sistemes Electrònics
dc.contributor
Universitat Politècnica de Catalunya. SEPIC - Sistemes Electrònics de Potència i de Control
dc.contributor.author
Santos Hernández, Sergio
dc.contributor.author
Gadelrab,, K.
dc.contributor.author
Barcons Xixons, Víctor
dc.contributor.author
Stefancich, M.
dc.contributor.author
Chiesa, Matteo
dc.date.issued
2012-07-20
dc.identifier
Santos, S. [et al.]. Quantification of dissipation and deformation in ambient atomic force microscopy. "New journal of physics", 20 Juliol 2012, vol. 14, p. 1-12.
dc.identifier
https://hdl.handle.net/2117/16725
dc.identifier
10.1088/1367-2630/14/7/073044
dc.description.abstract
A formalism to extract and quantify unknown quantities such as
sample deformation, the viscosity of the sample and surface energy hysteresis
in amplitude modulation atomic force microscopy is presented. Recovering
the unknowns only requires the cantilever to be accurately calibrated and the
dissipative processes occurring during sample deformation to be well modeled.
The theory is validated by comparison with numerical simulations and shown
to be able to provide, in principle, values of sample deformation with picometer
resolution.
dc.description.abstract
Postprint (published version)
dc.format
application/pdf
dc.relation
http://iopscience.iop.org/1367-2630/14/7/073044
dc.rights
Restricted access - publisher's policy
dc.subject
Àrees temàtiques de la UPC::Física
dc.subject
Àrees temàtiques de la UPC::Enginyeria electrònica
dc.subject
Atomic force microscopy
dc.subject
Dissipative process
dc.subject
Energy hysteresis
dc.subject
Picometer resolution
dc.subject
Sample deformation
dc.subject
Unknown quantity
dc.subject
Microscòpia de força atòmica
dc.title
Quantification of dissipation and deformation in ambient atomic force microscopy
