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Quantification of dissipation and deformation in ambient atomic force microscopy

Author

Santos Hernández, Sergio

Gadelrab,, K.

Barcons Xixons, Víctor

Stefancich, M.

Chiesa, Matteo

Other authors

Universitat Politècnica de Catalunya. Departament de Disseny i Programació de Sistemes Electrònics

Universitat Politècnica de Catalunya. SEPIC - Sistemes Electrònics de Potència i de Control

Publication date

2012-07-20

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Abstract

A formalism to extract and quantify unknown quantities such as sample deformation, the viscosity of the sample and surface energy hysteresis in amplitude modulation atomic force microscopy is presented. Recovering the unknowns only requires the cantilever to be accurately calibrated and the dissipative processes occurring during sample deformation to be well modeled. The theory is validated by comparison with numerical simulations and shown to be able to provide, in principle, values of sample deformation with picometer resolution.

Postprint (published version)

Document Type

Article

Language

English

Subjects and keywords

Àrees temàtiques de la UPC::Física; Àrees temàtiques de la UPC::Enginyeria electrònica; Atomic force microscopy; Dissipative process; Energy hysteresis; Picometer resolution; Sample deformation; Unknown quantity; Microscòpia de força atòmica

Related items

http://iopscience.iop.org/1367-2630/14/7/073044

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DIDL MARC MARC_CCUC METS OAI_DC ORE QDC RDF

Rights

Restricted access - publisher's policy

This item appears in the following Collection(s)

E-prints [73034]