Machine Learning for DFT and ATPG Yu HUANG (HiSILICON Inc. – China)
Functional Safety Challenges and Solutions for the ARM® MaliTM-G78AE GPU Prashant KULKARNI, Kartik KATHURIA (ARM – United Kingdom), Jussi PENNALA (ARM – Sweden)
3D IC DFT Implementation and Interconnect Test Based on IEEE 1838 Lukasz KOTYNIA, Frederic AZOULAY, Vivek CHICKERMANE, Sagar KUMAR, Rajesh KHURANA (CADENCE Design Systems – POLAND, US)
Conference report
English
Àrees temàtiques de la UPC::Enginyeria electrònica::Microelectrònica; Microelectronics; Integrated circuits; Spinitronics; Microelectrònica; Circuits integrats; Espintrònica
http://creativecommons.org/licenses/by-nc-nd/4.0/
Open Access
Attribution-NonCommercial-NoDerivatives 4.0 International
Congressos [11189]