dc.contributor.author
Eggersgluess, Stephan
dc.contributor.author
Harrison, Lee
dc.identifier
Eggersgluess, S.; Harrison, L. Vendor Session 2: DFT and Functional Safety. A: 27th IEEE European Test Symposium (ETS). 2022,
dc.identifier
https://hdl.handle.net/2117/369967
dc.description.abstract
Machine Learning for DFT and ATPG
Yu HUANG (HiSILICON Inc. – China)
dc.description.abstract
Functional Safety Challenges and Solutions for the ARM® MaliTM-G78AE GPU
Prashant KULKARNI, Kartik KATHURIA (ARM – United Kingdom), Jussi PENNALA
(ARM – Sweden)
dc.description.abstract
3D IC DFT Implementation and Interconnect Test Based on IEEE 1838
Lukasz KOTYNIA, Frederic AZOULAY, Vivek CHICKERMANE, Sagar KUMAR, Rajesh
KHURANA (CADENCE Design Systems – POLAND, US)
dc.format
application/pdf
dc.rights
http://creativecommons.org/licenses/by-nc-nd/4.0/
dc.rights
Attribution-NonCommercial-NoDerivatives 4.0 International
dc.subject
Àrees temàtiques de la UPC::Enginyeria electrònica::Microelectrònica
dc.subject
Microelectronics
dc.subject
Integrated circuits
dc.subject
Microelectrònica
dc.subject
Circuits integrats
dc.title
VES2 - DFT and Functional Safety
dc.type
Conference report
