2015-09-08T09:59:47Z
2015-09-08T09:59:47Z
2015-01-14
2015-09-08T09:59:47Z
The use of quartz tuning fork sensors as probes for scanning probe microscopy is growing in popularity. Working in shear mode, some methods achieve a lateral resolution comparable with that obtained with standard cantilevered probes, but only in experiments conducted in air or vacuum. Here, we report a method to produce and use commercial AFM tips in electrically driven quartz tuning fork sensors operating in shear mode in a liquid environment. The process is based on attaching a standard AFM tip to the end of a fiber probe which has previously been sharpened. Only the end of the probe is immersed in the buffer solution during imaging. The lateral resolution achieved is about 6 times higher than that of the etched microfiber on its own.
Article
Published version
English
Microscòpia de força atòmica; Microscòpia electrònica d'escombratge; Atomic force microscopy; Scanning electron microscopy
MDPI
Reproducció del document publicat a: http://dx.doi.org/10.3390/s150101601
Sensors, 2015, vol. 15, p. 1601-1610
http://dx.doi.org/10.3390/s150101601
cc-by (c) Gonzalez Claramonte, Laura et al., 2015
http://creativecommons.org/licenses/by/3.0/es