We study hydrogen stability and its evolution during thermal annealing in nanostructured amorphous silicon thin films. From the simultaneous measurement of heat and hydrogen desorption, we obtain the experimental evidence of molecular diffusion in these materials. In addition, we introduce a simple diffusion model which shows good agreement with the experimental data
Article
Published version
English
Hidrogenació; Hydrogenation; Silici; Silicon; Materials nanoestructurals; Nanostructure materials; Thin films; Capes fines
American Physical Society
info:eu-repo/semantics/altIdentifier/doi/10.1103/PhysRevB.80.073202
info:eu-repo/semantics/altIdentifier/issn/1098-0121
info:eu-repo/semantics/altIdentifier/eissn/1550-235X
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