Molecular hydrogen diffusion in nanostructured amorphous silicon thin films

Publication date

2009



Abstract

We study hydrogen stability and its evolution during thermal annealing in nanostructured amorphous silicon thin films. From the simultaneous measurement of heat and hydrogen desorption, we obtain the experimental evidence of molecular diffusion in these materials. In addition, we introduce a simple diffusion model which shows good agreement with the experimental data

Document Type

Article


Published version

Language

English

Publisher

American Physical Society

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