Title:
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Simulation of STEM-HAADF image contrast of Ruddlesden-Popper faulted LaNiO3 thin films
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Author:
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Coll Benejam, Catalina; López Conesa, Lluís; Rebled, J. M. (José Manuel); Magén, César; Sánchez Barrera, Florencio; Fontcuberta i Griñó, Josep; Estradé Albiol, Sònia; Peiró Martínez, Francisca
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Other authors:
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Universitat de Barcelona |
Abstract:
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LaNiO3 (LNO) thin films are widely used as electrode materials. Yet, their properties greatly depend on such parameters as strain state and defect density. In this work we present a detailed structural characterization of epitaxial LNO thin films grown on LaAlO3(001). Based on scanning transmission electron microscope - high-angle annular darkfield imaging (STEM-HAADF) contrast analysis and image simulations, Ruddlesden-Popper faulted configurations, with 1/2a<111> relative displacement of defect free perovskite blocks, are atomically modeled and simulated to disentangle the variation of Z-contrast in the experimental images |
Subject(s):
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-Pel·lícules fines -Thin films |
Rights:
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(c) American Chemical Society , 2017
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Document type:
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Article Article - Accepted version |
Published by:
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American Chemical Society
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