Simulation of STEM-HAADF image contrast of Ruddlesden-Popper faulted LaNiO<sub>3</sub> thin films

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RECERCAT Home > Universitat de Barcelona > Enginyeria Electrònica i Biomèdica > Articles publicats en revistes (Enginyeria Electrònica i Biomèdica) > View document

To access the full text documents, please follow this link: http://hdl.handle.net/2445/124987

dc.contributor	Universitat de Barcelona
dc.contributor.author	Coll Benejam, Catalina
dc.contributor.author	López Conesa, Lluís
dc.contributor.author	Rebled, J. M. (José Manuel)
dc.contributor.author	Magén, César
dc.contributor.author	Sánchez Barrera, Florencio
dc.contributor.author	Fontcuberta i Griñó, Josep
dc.contributor.author	Estradé Albiol, Sònia
dc.contributor.author	Peiró Martínez, Francisca
dc.date	2018-10-02T09:34:10Z
dc.date	2018-10-02T09:34:10Z
dc.date	2017-04-06
dc.date	2018-10-02T09:34:10Z
dc.identifier.citation	1932-7447
dc.identifier.citation	671835
dc.identifier.uri	http://hdl.handle.net/2445/124987
dc.format	5 p.
dc.format	application/pdf
dc.language.iso	eng
dc.publisher	American Chemical Society
dc.relation	Versió postprint del document publicat a: https://doi.org/10.1021/acs.jpcc.6b12484
dc.relation	Journal of Physical Chemistry C, 2017, vol. 121, num. 17, p. 9300-9304
dc.relation	https://doi.org/10.1021/acs.jpcc.6b12484
dc.rights	(c) American Chemical Society , 2017
dc.rights	info:eu-repo/semantics/openAccess
dc.subject	Pel·lícules fines
dc.subject	Thin films
dc.title	Simulation of STEM-HAADF image contrast of Ruddlesden-Popper faulted LaNiO<sub>3</sub> thin films
dc.type	info:eu-repo/semantics/article
dc.type	info:eu-repo/semantics/acceptedVersion
dc.description.abstract	LaNiO3 (LNO) thin films are widely used as electrode materials. Yet, their properties greatly depend on such parameters as strain state and defect density. In this work we present a detailed structural characterization of epitaxial LNO thin films grown on LaAlO3(001). Based on scanning transmission electron microscope - high-angle annular darkfield imaging (STEM-HAADF) contrast analysis and image simulations, Ruddlesden-Popper faulted configurations, with 1/2a<111> relative displacement of defect free perovskite blocks, are atomically modeled and simulated to disentangle the variation of Z-contrast in the experimental images

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