Periodicity in bimodal atomic force microscopy

Otros/as autores/as

Universitat Politècnica de Catalunya. Departament de Disseny i Programació de Sistemes Electrònics

Universitat Politècnica de Catalunya. CIRCUIT - Grup de Recerca en Circuits i Sistemes de Comunicació

Fecha de publicación

2015-07-28

Resumen

Periodicity is fundamental for quantification and the application of conservation principles of many important systems. Here, we discuss periodicity in the context of bimodal atomic force microscopy (AFM). The relationship between the excited frequencies is shown to affect and control both experimental observables and the main expressions quantified via these observables, i.e., virial and energy transfer expressions, which form the basis of the bimodal AFM theory. The presence of a fundamental frequency further simplifies the theory and leads to close form solutions. Predictions are verified via numerical integration of the equation of motion and experimentally on a mica surface.


Peer Reviewed


Postprint (published version)

Tipo de documento

Article

Lengua

Inglés

Publicado por

American Institute of Physics (AIP)

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Derechos

http://creativecommons.org/licenses/by/3.0/es/

Open Access

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E-prints [72986]